Shenzhen GBIT Testing Technology Co., Ltd
Phone: 0755-83698930
Email: dongni.zhang@gbit.net.cn
Address: Room 1203, Block C, World Trade Plaza, No. 9 Fuhong Road, Futian District, Shenzhen
全功能可靠性測試系統(tǒng)
* The same model of product may have multiple versions, and there may be differences between different versions of the product (including functional parameters, logo design, appearance details, product information, etc.). Please refer to the actual product for accuracy
STAR全功能測試系統(tǒng)滿足行業(yè)的可靠性測試需求，包括熱載子注入(HCI)、偏壓溫度不穩(wěn)定性(BTI)、OTF、時間相依介電質(zhì)崩潰(TDDB)、電子遷移(EM )、應(yīng)力誘導(dǎo)漏電流（SILC）等等。
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系統(tǒng)組成：
 | Gemini 全功能可靠性測試系統(tǒng) 是HCI、BTI、TDDB、SILC、電子遷移和應(yīng)力遷移等全功能可靠性測試系統(tǒng)。
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 | Pluto All-in-one Per-Pin SMU 可靠性測試系統(tǒng)是一款高端全功能測試系統(tǒng)，適用在封裝級與晶圓級測試，且涵蓋HCI，BTI，OTF，TDDB 和 EM 等所有可靠性要求。 產(chǎn)品功能： 是次世代的可靠性測試系統(tǒng)，可提高工程和生產(chǎn)需求的測量精度和效率。 特點(diǎn)和規(guī)格：
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Shenzhen GBIT Testing Technology Co., Ltd
Address: Room 1203, Block C, World Trade Plaza, No. 9 Fuhong Road, Futian District, Shenzhen
Mailbox：dongni.zhang@gbit.net.cn
Tel：0755-83698930
