Shenzhen GBIT Testing Technology Co., Ltd
Shenzhen GBIT Testing Technology Co., Ltd
Phone: 0755-83698930
Email: dongni.zhang@gbit.net.cn
Address: Room 1203, Block C, World Trade Plaza, No. 9 Fuhong Road, Futian District, Shenzhen
HCI/BTI封裝級(jí)可靠性測(cè)試儀
STAr Scorpio HCI/BTI 封裝級(jí)可靠性測(cè)試儀符合 JEDEC 的測(cè)試要求,可進(jìn)行先進(jìn)...
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STAR全功能測(cè)試系統(tǒng)滿足行業(yè)的可靠性測(cè)試需求,包括熱載子注入(HCI)、偏壓溫度不穩(wěn)定性(BTI)...
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模擬用在先進(jìn)尖端的尖端測(cè)試系統(tǒng)。晶圓級(jí)和封裝級(jí)的CIH、BTI、TDDB和SILC模擬測(cè)試,可在同一...
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hiVIP HCE/TDDB 封裝級(jí)可靠性測(cè)試系統(tǒng)
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DCEM 封裝級(jí)可靠性測(cè)試系統(tǒng)
DCEM 封裝級(jí)可靠性測(cè)試系統(tǒng)
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Mass production wafer level
TS3500 and TS3500-SE are functionally equivalent t...
Mass production wafer level
TS3500 and TS3500-SE are functionally equivalent t...
Mass production wafer level
TS3500 and TS3500-SE are functionally equivalent t...
Mass production wafer level
TS3500 and TS3500-SE are functionally equivalent t...
Mass production wafer level
TS3500 and TS3500-SE are functionally equivalent t...
Mass production wafer level
TS3500 and TS3500-SE are functionally equivalent t...
Mass production wafer level
TS3500 and TS3500-SE are functionally equivalent t...
Mass production wafer level
TS3500 and TS3500-SE are functionally equivalent t...